Sputtering vs Evaporation: Mechanism, Step Coverage, Adhesion and Alloy Composition
Both are physical vapor deposition (PVD) methods that turn a solid material into atoms and deposit them on the wafer. Sputtering bombards a target with argon ions from a plasma and deposits the atoms knocked out of it. Evaporation heats the material in high vacuum, with a resistive heater or an electron beam, until it evaporates. Sputtering keeps alloy composition and gives good adhesion, so it dominates chip interconnect and barrier metals. Evaporation sends atoms in straight lines, which is useful for forming electrodes by lift-off.
| Aspect | Sputtering | Vacuum evaporation (thermal / e-beam) |
|---|---|---|
| How atoms are released | Ar ions from a plasma strike the target and knock atoms out by momentum transfer | The material is heated by a resistive heater or an electron beam until it evaporates |
| Pressure and atom energy | Gas at about 0.1 to 1 Pa; arriving atoms typically have several to tens of eV | High vacuum (about 10⁻⁴ Pa or lower as a guide); arriving atoms have only about 0.1 eV |
| Step coverage | Limited, though better than evaporation; ionized sputtering or collimators improve deposition at the bottom of holes | Very poor: atoms travel in straight lines and do not reach shadowed areas |
| Adhesion and film quality | Good; films tend to be dense | Usually weaker than sputtering; improved by heating the substrate and similar methods |
| Alloy and compound composition | Films keep nearly the target composition; reactive sputtering also makes nitrides and other compounds | Composition tends to shift because the components have different vapor pressures (co-evaporation from several sources can adjust it) |
| Deposition rate | Practical rates with magnetrons; varies by material | Generally easy to make high |
| Effects on the substrate | Exposure to plasma and energetic particles can cause heating or damage | Relatively little substrate heating; X-rays from electron-beam evaporation can cause damage |
| Typical uses | Chip interconnect (Al, Cu), barrier metals (Ta, TaN, TiN), Cu seed layers, metals for silicides | Electrodes formed by lift-off (for example on compound semiconductors), research and development, OLED emitting layers |
Figures are typical orders of magnitude and vary by process generation and product.