What is Electromigration?
The movement of metal atoms in interconnects caused by electric current. It creates voids and hillocks that lead to open or short circuits.
Field: Reliability
The movement of metal atoms in interconnects caused by electric current. It creates voids and hillocks that lead to open or short circuits.
Field: Reliability
In electromigration, atoms are pushed along by the electron flow (the electron wind).
Where are voids due to electromigration likely to form?When electromigration drives atoms in one direction, a stress gradient builds along the line that drives a counterflow (backflow).
In electromigration testing, wires shorter than a certain l…Fast diffusion paths along the wire's length disappear, suppressing grain-boundary electromigration—a major lifetime boost for aluminum lines.
When a wire becomes narrower than its grains so that grain …Black's equation CMP MTTF (mean time to failure) Mobility Sputtering Dry etching CVD Selectivity Yield Preston's equation