Advanced transistors (FinFET and GAA)

For transistors with channels made of 2D materials such as MoS2, what is the main reason it is hard to deposit a uniform high-k gate dielectric by atomic layer deposition (ALD)?

  1. A2D materials are metals and react with the dielectric
  2. BTheir surfaces have almost no dangling bonds, so there are few sites where ALD precursors can adsorb and start film growth
  3. CThe surfaces of 2D materials are very rough, so ALD precursors cannot reach deep areas
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Answer: B. Their surfaces have almost no dangling bonds, so there are few sites where ALD precursors can adsorb and start film growth

Because 2D materials have no dangling bonds on their layer surfaces, they keep their mobility even below 1 nm thickness. The same property means ALD precursors hardly adsorb chemically on the surface, so films nucleate as islands at defects and grain boundaries and do not form thin, uniform dielectrics. Plasma-based methods tend to damage the layer, so approaches such as first forming a thin nucleation layer are being studied.

  • A. MoS2 and similar materials are semiconductors, not metals.
  • B. Correct. The chemically inert surface is the cause.
  • C. The surface is atomically flat; roughness is not the cause.
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More Advanced transistors (FinFET and GAA) questions

  1. Among 2D materials, why are transition metal dichalcogenides such as MoS2, rather than graphene, mainly studied as channels for logic transistors?
  2. What is the main reason monolithic 3D integration can connect layers far more densely than 3D packaging that bonds separately made chips?
  3. In a CFET (complementary FET), which statement about connecting to the lower of the two stacked transistors is correct?
  4. Which correctly describes the structure of a FinFET?
  5. Which correctly describes a GAA (gate-all-around) transistor?

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