What is NBTI (negative bias temperature instability)?
A degradation phenomenon in which the magnitude of a pMOS threshold voltage gradually increases under negative gate voltage at high temperature.
Field: Reliability
NBTI (negative bias temperature instability) in the explanations
DIBL is threshold lowering by drain voltage, and NBTI is a pMOS degradation mechanism.
Which phenomenon increases off-state leakage because band-t…NBTI (Negative Bias Temperature Instability) is degradation in which negative gate bias and high temperature applied to a pMOS increase interface states and charge in the dielectric, raising the absolute value of the threshold voltage.
Which degradation phenomenon causes the absolute value of a…It is the counterpart of NBTI, which occurs in pMOS.
In high-k/metal gate nMOS transistors, what is the degradat…
Questions that mention NBTI (negative bias temperature instability) (3)
- Which phenomenon increases off-state leakage because band-to-band tunneling current flows due to the strong field where the gate overlaps the drain?
- Which degradation phenomenon causes the absolute value of a pMOS transistor's threshold voltage to gradually increase under sustained negative gate voltage and high temperature?
- In high-k/metal gate nMOS transistors, what is the degradation called in which the threshold voltage shifts when positive gate voltage and high temperature are applied continuously?
Related terms
Threshold voltage GIDL (gate-induced drain leakage) DIBL Interface states Arrhenius model Bathtub curve Electromigration ESD (electrostatic discharge) FIT rate Hot carrier injection (HCI)