What is GIDL (gate-induced drain leakage)?

Off-state leakage caused by band-to-band tunneling in the strong field where the gate overlaps the drain. It is a concern for data retention in DRAM, among others.

Field: MOSFET

GIDL (gate-induced drain leakage) in the explanations

Questions that mention GIDL (gate-induced drain leakage) (3)

  1. Which phenomenon increases off-state leakage because band-to-band tunneling current flows due to the strong field where the gate overlaps the drain?
  2. Which combination lists the main components of leakage current in a MOSFET in the off state?
  3. Which correctly describes the main leakage paths that determine the data retention time of DRAM cells?

Related terms

DIBL NBTI (negative bias temperature instability) Refresh Body effect Channel-length modulation CMOS Flat-band voltage Inversion layer LDD structure Punch-through

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