What is ATPG (automatic test pattern generation)?
Automatically generating test patterns that detect faults from a circuit's netlist. It is used together with scan design.
Field: Testing and inspection
ATPG (automatic test pattern generation) in the explanations
This allows efficient testing of the combinational logic and enables automatic test pattern generation (ATPG).
Which correctly describes scan design, a form of design for…Though simple, it represents many physical defects, so it is widely used for automatic test pattern generation and evaluating fault coverage.
Which correctly describes the stuck-at fault model used in …ATPG is a technology that automatically generates input patterns that can detect each fault, based on fault models such as stuck-at faults.
What is it called to automatically generate test patterns t…
Questions that mention ATPG (automatic test pattern generation) (4)
- Which correctly describes scan design, a form of design for testability (DFT)?
- Which correctly describes the stuck-at fault model used in testing logic circuits?
- What is it called to automatically generate test patterns that detect faults from a circuit's netlist?
- In testing, what is the set of sequences of 0 and 1 signals applied to a chip's inputs, together with the expected responses, called?
Related terms
Fault coverage DFT (design for testability) Stuck-at fault Netlist ATE (automatic test equipment) BIST (built-in self-test) Burn-in IDDQ test KGD (known good die) Probe card