Yield and quality control

Which technique rejects chips that are within specification in test but show values far outside the distribution of the same lot?

  1. AATPG
  2. BPAT (part average testing)
  3. CAPC
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Answer: B. PAT (part average testing)

PAT (Part Average Testing) determines the distribution of measured values for each lot or wafer and excludes chips that deviate greatly from it even if they are within specification. Such chips may have latent defects and be prone to future failure, so PAT is used to improve the quality of automotive semiconductors.

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More Yield and quality control questions

  1. Which correctly describes the difference between the control limits of a control chart and a product's specification limits?
  2. What is the correct order of the PDCA cycle used in quality control and process improvement?
  3. Which of the seven QC tools is the approach of dividing data into groups, such as by machine, operator or material, and comparing them to find the causes of differences?
  4. Which of the seven QC tools is a pre-prepared table of items to check that makes it easy to record and tally inspection results and defect occurrences?
  5. Which is the general explanation of the difference between a product's "quality" and its "reliability"?