What is DFT (design for testability)?
A design approach that builds test features such as scan chains and BIST into the circuit in advance.
Field: Testing and inspection
DFT (design for testability) in the explanations
DFT techniques such as scan design raise both so that internal faults can be detected with fewer test patterns.
Which pair correctly names the two properties that design f…
Questions that mention DFT (design for testability) (2)
Related terms
ATPG (automatic test pattern generation) ATE (automatic test equipment) BIST (built-in self-test) Burn-in Fault coverage IDDQ test KGD (known good die) Probe card Scan test Stuck-at fault