What is Yield?

Yield in the explanations

• Sputter yield is the number of atoms ejected per incident ion, roughly 0.5–3 for argon ions at a few hundred eV.

  What does "sputter yield" mean in sputtering?

• Yield is calculated as good units ÷ total units.

  A wafer yields 500 chips, of which 450 are good. What is th…

• In the Poisson model, yield is Y = exp(−D × A) (D: defect density, A: chip area).

  With the same defect density, what generally happens to yie…

Questions that mention Yield (44)

1. Which correctly describes redundancy repair, used to improve DRAM yield?
2. What does "sputter yield" mean in sputtering?
3. A wafer yields 500 chips, of which 450 are good. What is the yield of this wafer?
4. With the same defect density, what generally happens to yield when chip area is increased?
5. Among the causes of yield loss, what are defects called that recur in specific patterns due to, for example, interactions between design and manufacturing processes?
6. In the Poisson model Y = exp(−D × A), with defect density D = 0.1 /cm² and chip area A = 1 cm², approximately what is the yield?
7. What is it called that shows yield improving over time as defect causes are analyzed and addressed after a new process is launched?
8. A wafer has 600 chips and the yield is 80%. How many good chips are there?
9. If wafer process yield is 95% and wafer test yield is 90%, approximately what is the overall yield obtained by multiplying them?
10. When analyzing yield data, which example correctly illustrates that "a correlation between two quantities does not mean one causes the other"?
11. Which correctly describes efforts to raise yield by analyzing the large amounts of equipment data, metrology data and test results accumulated in a fab with machine learning and similar methods?
12. Which yield model accounts for defects that occur clustered unevenly on the wafer?
13. What is the analysis called that statistically identifies, from the manufacturing histories of many lots, the tools, chambers, materials and the like commonly used by low-yield lots?
14. In analog circuit design, which technique repeatedly simulates with randomly applied transistor variations from manufacturing to estimate performance distributions and yield?
15. When adding two's complement numbers, which condition indicates that an overflow has occurred?

Related terms

CMP Wafer test (probe test) Threshold voltage SiC (silicon carbide) Chiplet Redundancy repair Sputtering PDK (process design kit) Two's complement Oversampling