What is Poisson yield model?
A model that assumes defects are randomly distributed and expresses yield as Y = exp(−D×A), where D is defect density and A is chip area.
Field: Yield and quality control
Related terms
APC (advanced process control) Cause-and-effect diagram Control chart FMEA (failure mode and effects analysis) Killer defect Pareto chart Process capability index (Cpk) SPC (statistical process control) Systematic defect Yield