Yield and quality control

A wafer yields 500 chips, of which 450 are good. What is the yield of this wafer?

  1. A80%
  2. B90%
  3. C95%
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Answer: B. 90%

Yield is calculated as good units ÷ total units. 450 ÷ 500 = 0.9, so the yield is 90%.

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More Yield and quality control questions

  1. With the same defect density, what generally happens to yield when chip area is increased?
  2. In control charts (Shewhart control charts) used for process control, how are the control limits generally set?
  3. Which correctly describes the purpose of a Pareto chart used in quality control?
  4. Which formula gives the process capability index Cp (when the process mean coincides with the center of the specification)? (σ: process standard deviation)
  5. Among the causes of yield loss, what are defects called that recur in specific patterns due to, for example, interactions between design and manufacturing processes?