What is Killer defect?

A defect that makes a chip fail, such as particles or pattern anomalies of a size and location that cause shorts or opens in wiring.

Field: Yield and quality control

Related terms

APC (advanced process control) Cause-and-effect diagram Control chart FMEA (failure mode and effects analysis) Pareto chart Poisson yield model Process capability index (Cpk) SPC (statistical process control) Systematic defect Yield

Back to the glossary