Testing and inspection

Which correctly describes a probe card?

  1. AA mold for encapsulating chips
  2. BA container for transporting wafers
  3. CA fixture that contacts needles to the chip electrodes on a wafer and connects them electrically to the tester
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Answer: C. A fixture that contacts needles to the chip electrodes on a wafer and connects them electrically to the tester

A probe card is a fixture used in wafer test, with many needles (probes) arranged to match the layout of the chip's bond pads. A machine called a prober moves the wafer to align the needles with the electrodes, electrically connecting the tester and the chip.

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More Testing and inspection questions

  1. Which correctly describes the stuck-at fault model used in testing logic circuits?
  2. Which is the correct definition of fault coverage for test patterns?
  3. What is KGD (Known Good Die), which is important when mounting several chips in one package?
  4. What is the technique called in which a tester measures several chips simultaneously to lower test cost?
  5. What is it called to automatically generate test patterns that detect faults from a circuit's netlist?