Testing and inspection

What is the technique called in which a tester measures several chips simultaneously to lower test cost?

  1. ABurn-in
  2. BMulti-site test (parallel test)
  3. CWire bonding
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Answer: B. Multi-site test (parallel test)

Test cost depends heavily on tester time. In multi-site testing, one tester measures several chips in parallel, lowering test time and cost per chip. In memory testing, a very large number of chips may be measured at once.

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