Testing and inspection

Which is the correct definition of fault coverage for test patterns?

  1. AThe fraction of modeled faults that the test can detect
  2. BThe fraction of shipped products that are defective
  3. CThe fraction of good chips on a wafer
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Answer: A. The fraction of modeled faults that the test can detect

Fault coverage is the fraction of all modeled faults that the test patterns can detect. If it is low, defective products are more likely to be missed in test and shipped. Very high fault coverage is required for LSIs that demand high quality, such as automotive devices.

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More Testing and inspection questions

  1. What is KGD (Known Good Die), which is important when mounting several chips in one package?
  2. What is the technique called in which a tester measures several chips simultaneously to lower test cost?
  3. What is it called to automatically generate test patterns that detect faults from a circuit's netlist?
  4. What is the test called that measures the supply current of a CMOS circuit in a quiescent state to detect defects such as bridging faults?
  5. What is the main use of boundary scan, specified in IEEE 1149.1 (JTAG)?