Testing and inspection

For a chip that failed scan testing, what is the process called that logically narrows down candidate fault locations from which outputs mismatched on which patterns?

  1. AFault diagnosis
  2. BGettering
  3. CLithography
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Answer: A. Fault diagnosis

Fault diagnosis matches the failing chip's test results against simulations assuming faults, narrowing down the nets or cells likely to be faulty. It narrows where to do physical failure analysis and helps identify manufacturing problems and improve yield.

  • A. Correct. It narrows candidate fault locations from test results.
  • B. Gettering is a technique for capturing harmful impurities.
  • C. Lithography is the pattern transfer step.
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More Testing and inspection questions

  1. Which technique models defects such as transistor shorts and opens inside standard cells based on each cell's circuit and generates test patterns for them?
  2. Which correctly describes wafer test (probe test)?
  3. Which correctly describes the purpose of burn-in?
  4. Which correctly describes scan design, a form of design for testability (DFT)?
  5. Which items are mainly checked in a semiconductor DC test?