Which technique models defects such as transistor shorts and opens inside standard cells based on each cell's circuit and generates test patterns for them?

Answer: B. Cell-aware test

Traditional fault models such as stuck-at focus only on cell input and output pins. Cell-aware test simulates transistor-level defects inside cells and generates patterns to detect them. It helps reduce field failures from intra-cell defects, which have increased in fine processes.

• A. Visual inspection cannot find internal electrical defects.
• B. Correct. It models defects inside cells.
• C. IDDQ detects defects through supply current but is separate from modeling intra-cell defects.