What is Scan test?

A test method that uses scan chains, formed by linking a circuit's flip-flops in series, to set and observe internal states.

Field: Testing and inspection

Scan test in the explanations

In large LSIs, the volume of scan test patterns becomes enormous, straining tester memory and test time.
What is the technology called that expands test patterns in…

Questions that mention Scan test (2)

What is the technology called that expands test patterns inside the chip and compresses the responses to reduce scan test data volume and test time?
When compressing scan test outputs, why must signals whose value (0 or 1) is undetermined in simulation (unknowns, X) be removed?

Related terms

ATE (automatic test equipment) ATPG (automatic test pattern generation) BIST (built-in self-test) Burn-in DFT (design for testability) Fault coverage IDDQ test KGD (known good die) Probe card Stuck-at fault

Back to the glossary