Testing and inspection

What is the technology called that expands test patterns inside the chip and compresses the responses to reduce scan test data volume and test time?

  1. ATest compression (scan compression)
  2. BBurn-in
  3. CIDDQ test
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Answer: A. Test compression (scan compression)

In large LSIs, the volume of scan test patterns becomes enormous, straining tester memory and test time. Test compression uses on-chip circuits to expand a small amount of input data into many scan chains and compresses the outputs for comparison, greatly reducing data volume and test time.

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More Testing and inspection questions

  1. What is the test called that runs at the actual operating frequency to detect defects where signals propagate too slowly?
  2. What is it called to classify products by performance, such as operating speed and power consumption, based on test results?
  3. In testing, what is it called to set pass/fail limits slightly tighter than the product specification to allow for measurement error and drift over time?
  4. In developing test programs, which is emphasized to lower test cost?
  5. Which method is now common for passing information on chips judged defective in wafer test to the later assembly process?