What is IDDQ test?
A test that measures the supply current of a CMOS circuit at rest and flags defects such as bridging faults when it is abnormally high.
Field: Testing and inspection
Related terms
ATE (automatic test equipment) ATPG (automatic test pattern generation) BIST (built-in self-test) Burn-in DFT (design for testability) Fault coverage KGD (known good die) Probe card Scan test Stuck-at fault