What is Derating?

Using parts with margin below their ratings for voltage, current, temperature and so on, rather than at the full rating, to improve reliability. Typical guidelines are voltage at no more than 70 to 80% of rating, or junction temperature at no more than 125 °C against a 150 °C maximum.

Japanese name: ディレーティング

Derating appears in 6 practice questions across 4 topics, including Timing analysis and CDC, How to read datasheets, Power semiconductors.

Field: How to read datasheets

Try it: questions about Derating

When choosing power devices, why are devices with a voltage rating higher than the actual operating voltage used (derating)?

  1. ATo ensure reliability against switching surge voltages and failures caused by cosmic rays
  2. BTo lower the component price
  3. CTo lower the on-resistance
Show answer and explanation

Answer: A. To ensure reliability against switching surge voltages and failures caused by cosmic rays

Real circuits add surge voltages from parasitic inductance during switching, and at sustained high voltage, cosmic-ray neutrons can generate charge inside the device and cause sudden failure (single-event burnout), whose probability rises steeply with voltage. Designers therefore choose devices rated about 1.5× the operating voltage—650 V parts for a 400 V bus, for example—with even more margin at high altitude.

For OCV derating in setup analysis, the launch clock path and data path delays are multiplied by 1.1 and the capture clock path delay by 0.9. With a launch clock path of 1.0 ns, a data path (including clock-to-output) of 1.5 ns, a capture clock path of 1.0 ns (no common portion), a period of 3.0 ns and a setup time of 0.1 ns, what is the setup slack?

  1. A1.05 ns
  2. B1.40 ns
  3. C1.25 ns
Show answer and explanation

Answer: A. 1.05 ns

OCV derating accounts for delay varying with location even within the same chip, and for setup assumes the most pessimistic combination (slow launch side, early capture clock). The arrival time is 1.1 × (1.0 + 1.5) = 2.75 ns and the required time is 3.0 + 0.9 × 1.0 − 0.1 = 3.8 ns, so the slack is 1.05 ns. 1.40 ns is the value without derating, and 1.25 ns applies the factor to the data path only. In hold analysis the factors are applied the other way around.

Derating in the explanations

Questions that mention Derating (6)

  1. When choosing power devices, why are devices with a voltage rating higher than the actual operating voltage used (derating)?
  2. For OCV derating in setup analysis, the launch clock path and data path delays are multiplied by 1.1 and the capture clock path delay by 0.9. With a launch clock path of 1.0 ns, a data path (including clock-to-output) of 1.5 ns, a capture clock path of 1.0 ns (no common portion), a period of 3.0 ns and a setup time of 0.1 ns, what is the setup slack?
  3. In STA with OCV derating, when the launch and capture clock paths share a common portion, which correctly describes CRPR (common path pessimism removal)?
  4. Which correctly describes the concept of component "derating"?
  5. In static timing analysis, what is the technique called that multiplies delays by factors to add margin for transistor and wire delays varying by location even within the same chip?
  6. An IC with maximum junction temperature Tj(max) = 125 °C and θJA = 50 °C/W is used at an ambient temperature Ta = 85 °C. What is the upper limit on allowable power dissipation?

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Related terms

OCV (on-chip variation) Slack STA (static timing analysis) Setup time CRPR (clock reconvergence pessimism removal) Burn-in Threshold voltage Allowable power dissipation 5 V tolerant Absolute maximum ratings

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