Yield and quality control

Among defects on a wafer, what are those called that actually cause electrical failure of a chip?

  1. AKiller defects
  2. BFalse defects
  3. CNuisance defects
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Answer: A. Killer defects

Not every defect found in inspection leads to failure. Defects that cause electrical failure, such as a large particle positioned to bridge wires, are called killer defects. The probability of failure is estimated from defect size and location to predict the impact on yield.

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More Yield and quality control questions

  1. Which chart divides data into intervals and shows the frequencies as bars to see the shape of the distribution of variation?
  2. Which process capability index is used when the process mean is offset from the center of the specification?
  3. Which type of control automatically adjusts equipment processing conditions for the next lot or wafer based on, for example, measurement results from earlier steps?
  4. Which technique identifies possible failure modes in a product or process, evaluates their effects and severity, and takes countermeasures in advance?
  5. Which chart plots pairs of two characteristic values to examine their correlation?