Testing and inspection

In developing test programs, which is emphasized to lower test cost?

  1. AOptimizing test items and their order to shorten test time while still detecting defects adequately
  2. BMeasuring every item the maximum number of times
  3. CSkipping tests for items with many failures
Show answer and explanation

Answer: A. Optimizing test items and their order to shorten test time while still detecting defects adequately

Test cost is roughly proportional to test time, so test items are narrowed down as far as quality allows, and the order and conditions of measurements are refined to shorten test time. Items that past data show almost never fail may be reconsidered, and multi-site testing is also combined.

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More Testing and inspection questions

  1. Which method is now common for passing information on chips judged defective in wafer test to the later assembly process?
  2. For automotive semiconductors, what is the main reason for testing not only at room temperature but also at high and low temperatures?
  3. In memory testing, which test pattern repeats writing and reading 0s and 1s while stepping through addresses in order, detecting defects such as interference between adjacent cells?
  4. Which correctly describes ATE (automatic test equipment)?
  5. In wafer test, what is it called to push the probe needles slightly further after they touch the bond pads to ensure contact?