Testing and inspection
What is the test called that measures the supply current of a CMOS circuit in a quiescent state to detect defects such as bridging faults?
- AIDDQ test
- BFunctional test
- CBurn-in
Show answer and explanation
Answer: A. IDDQ test
A CMOS circuit draws almost no supply current when quiescent. Defects such as shorts between wires cause abnormal current to flow, so measuring the quiescent supply current (IDDQ) reveals them. However, as leakage current grows with scaling, distinguishing defective parts from good ones becomes difficult.