Yield and quality control

Which chart plots pairs of two characteristic values to examine their correlation?

  1. AScatter diagram
  2. BPareto chart
  3. CControl chart
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Answer: A. Scatter diagram

A scatter diagram plots each data point with, for example, film thickness on the horizontal axis and transistor current on the vertical axis, to examine the relationship between two quantities. Points rising to the right show positive correlation, and points falling to the right show negative correlation. It is one of the seven QC tools, used for tasks such as inferring defect causes.

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More Yield and quality control questions

  1. What is it called that shows yield improving over time as defect causes are analyzed and addressed after a new process is launched?
  2. What is the purpose of evaluating manufacturing variation separately by factor, such as lot-to-lot, wafer-to-wafer and within-wafer?
  3. Which correctly describes the idea behind the quality management activity called 'Six Sigma'?
  4. On the same wafer, why does making chip area smaller greatly increase the number of good chips per wafer?
  5. Which control chart is used to control the fraction defective?