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Automotive Semiconductors and Functional Safety

In ISO 26262, which correctly lists the three factors evaluated when determining the ASIL through hazard analysis and risk assessment (HARA)?

  1. ASeverity (S), exposure (E), controllability (C)
  2. BFailure rate (λ), diagnostic coverage (DC), fault tolerant time interval (FTTI)
  3. CComponent price, production volume, development period
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Answer: A. Severity (S), exposure (E), controllability (C)

The ASIL is determined for each hazardous event by evaluating three factors: severity S, representing how serious the injuries are; exposure E, representing the frequency or duration of exposure to driving situations in which the hazard can occur; and controllability C, representing how likely the driver or others are to avoid the hazard. For example, sudden loss of braking at high speed has high severity and is hard to avoid, so it receives a high ASIL. Failure rate, diagnostic coverage and FTTI are quantities used after the ASIL is determined, to evaluate whether a design meets its requirements.

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More Automotive Semiconductors and Functional Safety questions

  1. Which correctly describes the ASIL in ISO 26262?
  2. A hazardous event was assessed as severity S3, exposure E4 and controllability C3, giving ASIL D. If, for the same event, only controllability were C2 (most drivers can normally avoid the hazard), what would the ASIL be?
  3. Which correctly describes a "safety goal" in ISO 26262?
  4. Which correctly pairs the descriptions of random hardware failures and systematic failures as distinguished in ISO 26262?
  5. For PMHF, the metric for the probability that a safety goal is violated due to random hardware failures, the target guideline for ASIL D is less than 10 FIT. What is this expressed as a probability per hour?