CZ vs FZ Silicon: Czochralski and Float-Zone Crystal Growth
Almost all silicon wafers start as a single crystal grown by one of two methods. In the Czochralski (CZ) method, a seed crystal is dipped into molten silicon in a quartz crucible and slowly pulled up. In the float-zone (FZ) method, a polysilicon rod is melted in a narrow zone by a coil and the zone is moved along the rod, so no crucible touches the silicon. CZ is cheaper and makes large wafers; FZ gives purer silicon.
| Aspect | CZ method | FZ method |
|---|---|---|
| How the crystal is grown | A seed is dipped into silicon melted in a quartz crucible and pulled up while rotating | A radio-frequency coil melts a narrow zone of a polysilicon rod, and the zone is moved along it |
| Contact with a crucible | Yes, so oxygen from the quartz dissolves into the melt | No, so there is very little oxygen |
| Oxygen content | High | Very low |
| Purity and resistivity | Lower purity; resistivity limited (the MCZ variant with a magnetic field helps) | Very high purity and very high resistivity |
| Doping | Dopant is added to the melt; concentration varies along the ingot | Gas doping, or neutron transmutation doping (NTD) for uniform phosphorus |
| Wafer diameter | Up to 300 mm in production | Typically up to about 200 mm; larger sizes are difficult |
| Cost | Lower, and large ingots give good throughput | Higher |
| Mechanical strength and gettering | Oxygen precipitates add strength and trap metal impurities (intrinsic gettering) | Lacks these benefits, so wafers can be more fragile |
| Typical uses | The large majority of wafers: logic, memory and solar cells | High-voltage power devices (such as IGBTs), detectors, high-resistivity RF devices |
Figures are typical orders of magnitude and vary by process generation and product.