Testing and inspection

What is the technique called that dynamically changes test items or limits per chip or per lot based on intermediate results and statistics, such as from wafer test?

  1. AAdaptive test
  2. BDummy test
  3. CBlack-box test
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Answer: A. Adaptive test

Adaptive test adds or skips tests or changes limits based on results from earlier steps or other chips on the same wafer, statistical outlier detection and the like. It can cut test time while maintaining quality and make latent defects easier to find.

  • A. Correct. Tests are changed dynamically based on results.
  • B. This is not a common technique by that name.
  • C. Black-box testing is a software testing concept of checking inputs and outputs without seeing the internals.
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More Testing and inspection questions

  1. In AD converter testing, what is the main purpose of inputting a slowly varying sine wave or similar and counting how often each output code appears (a histogram)?
  2. For a chip that failed scan testing, what is the process called that logically narrows down candidate fault locations from which outputs mismatched on which patterns?
  3. Which technique models defects such as transistor shorts and opens inside standard cells based on each cell's circuit and generates test patterns for them?
  4. Which correctly describes wafer test (probe test)?
  5. Which correctly describes the purpose of burn-in?