CMP and cleaning

In Cu interconnect CMP, why is polishing generally divided into stages?

  1. ABecause Cu and the barrier metal beneath it (such as TaN) need different polishing conditions, so most of the Cu is removed first and then the barrier
  2. BTo give the polishing tool a rest
  3. CTo make the Cu thicker
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Answer: A. Because Cu and the barrier metal beneath it (such as TaN) need different polishing conditions, so most of the Cu is removed first and then the barrier

In Cu interconnects, the thick Cu outside the trenches, the thin barrier metal beneath it and the insulator below are polished in sequence. To optimize removal rate and selectivity for each material, polishing is split into a stage that removes Cu quickly and a stage that removes the barrier and finishes planar, using different slurries.

  • A. Correct. Polishing proceeds in stages with conditions changed for each material.
  • B. It is not to rest the tool.
  • C. CMP removes Cu, not adds it.
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More CMP and cleaning questions

  1. Which correctly describes the general difference between hard and soft CMP polishing pads?
  2. What is the state of a silicon surface whose last cleaning step was dilute hydrofluoric acid?
  3. What is the main purpose of installing filters in the lines that supply CMP slurry to the polisher?
  4. When removing particles from a wafer surface by cleaning, how does particle size generally relate to ease of removal?
  5. As CMP continues, the polishing pad temperature rises. How does the removal rate generally change?