CMP and cleaning

When removing particles from a wafer surface by cleaning, how does particle size generally relate to ease of removal?

  1. AThe smaller the particle, the stronger its adhesion relative to its weight and the forces from flow, so it is harder to remove
  2. BParticle size does not matter
  3. CSmaller particles are easier to remove
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Answer: A. The smaller the particle, the stronger its adhesion relative to its weight and the forces from flow, so it is harder to remove

Adhesion forces such as van der Waals forces that hold particles to a surface scale roughly with particle size, while forces from liquid flow or ultrasound shrink with the square or cube of size. Smaller particles are therefore harder to remove, and cleaning has grown more difficult with scaling.

  • A. Correct. Adhesion becomes relatively stronger for smaller particles.
  • B. Particle size strongly affects ease of removal.
  • C. Smaller particles are harder to remove.
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More CMP and cleaning questions

  1. As CMP continues, the polishing pad temperature rises. How does the removal rate generally change?
  2. In SC-1 (a mixture of ammonia and hydrogen peroxide), what role does the hydrogen peroxide play?
  3. Which method is commonly used to count particles on a wafer surface after cleaning?
  4. Why is it considered important to transfer wafers to cleaning right after CMP while still wet, without letting them dry?
  5. What is a point of caution for batch cleaning, in which many wafers are immersed in the same tank of cleaning solution?