Yield and quality control
Which concept expresses, from particle size and wiring layout, the area in which a falling particle could cause a failure?
- AActive area
- BDie area
- CCritical area
Show answer and explanation
Answer: C. Critical area
Critical area is the area of positions where a particle of a given size would cause a short or open in the wiring. It becomes larger the denser the wiring and the larger the particle. Critical area and defect density are used to predict yield and improve layouts.