Automotive Semiconductors and Functional Safety

Which best describes the "zero defect" philosophy required for automotive semiconductors?

  1. ASince a certain percentage of defects is unavoidable, assume that parts failing in the field will be replaced free of charge with new ones and that the cost will be covered by warranty
  2. BStrict 100% inspection before shipment is sufficient, so no particular effort is needed in design or process control
  3. CTargeting zero defects, prevent defects from being built in and escaping at every stage of design, manufacturing and test, and identify the cause of even a single defect to prevent recurrence
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Answer: C. Targeting zero defects, prevent defects from being built in and escaping at every stage of design, manufacturing and test, and identify the cause of even a single defect to prevent recurrence

Car failures can endanger lives, and a single vehicle uses thousands of semiconductors, so the defect rate per component must be extremely low. Zero defect is a philosophy that targets zero defects and combines design margin, process control and testing that removes outlier chips to prevent defects from being built in and escaping. If even one defect occurs in the field, the root cause is analyzed and used to prevent recurrence. Inspection alone still lets defects slip through, so design and process control are also essential.

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More Automotive Semiconductors and Functional Safety questions

  1. Which correctly describes PPAP (Production Part Approval Process) used in the automotive industry?
  2. For an automotive semiconductor, which is the correct way to proceed when you want to change the manufacturing fab or the materials used?
  3. What is the main purpose of recording the lot number, wafer number and on-wafer coordinates during wafer test in electrically programmable non-volatile memory (such as fuses) inside an automotive IC?
  4. In qualification of automotive ICs, what is the main reason HAST (a biased test in pressurized water vapor at around 130 °C and 85% RH) is sometimes used instead of the temperature humidity bias test (THB) run at 85 °C and 85% RH for 1000 hours?
  5. Why are latch-up tests on automotive ICs required not only at room temperature but also at the product's maximum operating temperature?