Yield and quality control

Which correctly describes the purpose of a Pareto chart used in quality control?

  1. ATo examine the correlation between two variables
  2. BTo monitor process abnormalities over time
  3. CTo arrange defect categories in descending order of count and find the items to address first
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Answer: C. To arrange defect categories in descending order of count and find the items to address first

A Pareto chart arranges defect categories or causes as bars in descending order of count (or monetary loss), overlaid with a line showing the cumulative percentage. A few items often account for most of the total, so the items to tackle first are clear at a glance. Correlation is examined with scatter diagrams and abnormalities over time with control charts.

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More Yield and quality control questions

  1. Which formula gives the process capability index Cp (when the process mean coincides with the center of the specification)? (σ: process standard deviation)
  2. Among the causes of yield loss, what are defects called that recur in specific patterns due to, for example, interactions between design and manufacturing processes?
  3. Which diagram organizes the relationship between a problem (effect) and the factors that influence it in a shape like a fish skeleton?
  4. What is the main purpose of analyzing wafer maps, which show wafer test results as pass/fail for each chip position on the wafer?
  5. With all else equal, about how many times larger does wafer area become when wafer diameter is increased from 200 mm to 300 mm?