Emerging memories

What challenge results from the large variation in resistance of ReRAM cells?

  1. AThe margin for distinguishing high and low resistance shrinks, making multi-level storage and high capacity difficult
  2. BWriting becomes too fast
  3. CThe cells become lighter
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Answer: A. The margin for distinguishing high and low resistance shrinks, making multi-level storage and high capacity difficult

In ReRAM, conductive filaments form probabilistically, so resistance varies from cell to cell and from write to write. When the distributions of the high- and low-resistance states approach each other, the read margin shrinks, making it difficult to store multiple bits per cell or to build large arrays.

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  1. In general, which memory has the fewest possible rewrite cycles?
  2. Which of the following is non-volatile memory that retains data after power is removed?
  3. What does the "M" in MRAM stand for?
  4. Which correctly describes the idea of "universal memory" that many emerging memory efforts have aimed for?
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