Yield and quality control

Which control chart is used to control the fraction defective?

  1. AX̄-R chart
  2. Bp chart
  3. CScatter diagram
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Answer: B. p chart

A p chart is an attribute control chart that plots and controls the fraction defective for each sample such as a lot. To control the mean and spread of variables such as film thickness and dimensions, an X̄-R chart is used.

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More Yield and quality control questions

  1. What is the purpose of inspecting for defects after each step and extracting only the defects newly added since the previous step?
  2. Which concept expresses, from particle size and wiring layout, the area in which a falling particle could cause a failure?
  3. Which technique digs into a problem by repeatedly asking 'why' to find its true cause?
  4. A wafer has 600 chips and the yield is 80%. How many good chips are there?
  5. If wafer process yield is 95% and wafer test yield is 90%, approximately what is the overall yield obtained by multiplying them?