PN junctions and diodes
What can be evaluated by measuring the capacitance of a reverse-biased PN junction while varying the voltage (C-V measurement)?
- AThe color of emitted light
- BOnly the carrier mobility
- CThe doping concentration on the lightly doped side and its depth profile
Show answer and explanation
Answer: C. The doping concentration on the lightly doped side and its depth profile
Increasing reverse bias widens the depletion layer and reduces capacitance. How it changes depends on the doping at the edge of the depletion layer, so C-V measurements can determine the doping concentration on the lightly doped side and its depth profile.